For more information on some of the topics discussed in this video, check out some of our articles below:
Useful tool: IMFP calculator
Questions
1: The IMFP of Ag 3d electrons (Kinetic energy = 1119.7 eV) travelling through an unknown mixed oxide matrix overlayer is determined to be 2.42 nm. What is the information depth of this system?
2: This unknown sample is compared to a number of well defined standards. SiO2, TiO2 and Graphite overlayers are prepared atop a silver sample of equal thicknesses. If the IMFP of Ag 3d electrons through each is 3.18, 2.27 and 3.07 nm respectively, in what order should we expect to see an increasing intensity of our Ag 3d spectra (lowest to highest)?
3. The IMFP of Si 2p photoelectrons travelling through a SiO2 overlayer, having been excited by various sources is given in nm below:
- Mg Kα = 2.67
- Al Kα = 3.09
- Ag Lα = 5.6
- Cr Kα = 9.34
- Ga Kα = 14.83
Which sources would you require to analyse the substrate of the following systems?
- 2 nm SiO2/Si
- 6 nm SiO2/Si
- 9 nm SiO2/Si
- 13 nm SiO2/Si
- 30 nm SiO2/Si
In section 5, we explore the many additional peaks that may appear in our XPS spectra – shake-up peaks, satellites, plasmons – as well as discussing the asymmetry exhibited by certain peaks and look at what causes this.
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