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Synchotron XPS

  • Created July 24, 2020
  • Author Mark Isaacs
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Diamond light source | Harwell Campus Oxford

Synchotron XPS has numerous benefits and advantages over lab based sources, the high photon flux permits superior analysis of adsorbates and trace elements, the tunable energy provides a method for the study of buried layers or density of states and dedicated NAP-XPS systems provide experimental stations to probe samples under simulated operating conditions.

Below is a list of the numerous XPS beamlines around Europe and beyond. Whilst not an exhaustive list, it may prove a useful resource for researchers looking for XPS beamlines.

Europe

UK, Diamond Light Source

I09: Surface and Interface Structural Analysis

Contact: Tien-Lin Lee

Techniques: XPS (230-18000 eV), Near Edge X-ray Absorption Fine Structure (NEXAFS), X-ray Standing Waves (XSW), Photoelectron Diffraction (PhD) and X-ray Reflectivity (XRR), Hard X-ray Photoelectron Spectroscopy (HAXPES)

A range of techniques and tunable photon energy makes this source perfect for the analysis of buried layers. Very large energy range possible. Prep chamber allows heating to 1500K and cooling < 50K.

B07: Versatile Soft X-ray (VERSOX)

Contact: Georg Held

Techniques: XPS (50 – 2800 eV), NAP-XPS and Near Edge X-ray Absorption Fine Structure (NEXAFS)

B07 is home to the ambient pressure XPS system at Diamond, and as such this beamline is perfect for those wishing to study samples under controlled atmospheres. Heating and cooling available – 250 K – 300 K (AP); 150 K – 300 K (UHV) up to 750 K at ambient pressure/1100 K in UHV.

Germany, BESSY

ISSIS: Innovative Station for In Situ Spectroscopy

Contact: Michael Hävecker

Techniques: XPS, NAP-XPS, NEXAFS, Heating up to 1000K, Electron impact mass spectrometer, proton-transfer-reaction mass spectrometer, micro gas chromatograph

The ISSIS station at BESSY has good capabilities for NAP-XPS and is ideal for such experiments.

UE52_PGM CoESCA

Contact: Ruslan Ovsyannikov

Techniques: XPS (110 – 1900 eV), UPS, Angle resolved photoemission spectroscopy (ARPES), TOF, Heating (30-1200K).

Prep chamber with free ports, heating to 800K, balance and mass spec.

This beamline has particularly useful angle resolved capabilities for those working with electronic materials.

Italy, Elettra

1.1L: NanoESCA

Contact: Claus M. Schneider

Techniques: Photoemission Electron Microscopy (PEEM), 50 – 1000 eV

A specialized form of ESCA, using photoemission to image. Whilst not exactly an XPS beamline, it may be of interest to XPS researchers.

2.2L: ESCA Microscopy

Contact: Luca Gregoratti

Techniques: Scanning photoelectron microscopy (SPEM), NAP-SPEM, 90 – 1500 eV (or 130 – 1800 eV when storage ring operating at 2.4 GeV)

A unique beamline, 2.2L may operate either in spectroscopy or imaging mode. This beamline provides photoemission imaging with a lateral resolution of 40 nm, providing the capability to prepare an incredibly high resolution chemical state map with an option high pressure chamber for NAP experiments.

2.2R: SuperESCA

Contact: Silvano Lizzit

Techniques: High resolution XPS (90 – 1500 eV, or 130 – 1800 eV when storage ring operating at 2.4 GeV), Low energy electron diffraction (LEED), Plasma source, Sputter gun, Heating stage/He cryostat (15 – 1500K), Gas dosing

The CoSMoS end station also provides variable temperature (80-600K) STEM and monochromated Al and Ag X-ray sources with heating and cooling from (80 – 1300K)

High flux and fast analysis times permit analysis of changing states in real time. The use of gas dosing allows for model studies of adsorbates onto single crystals, perfect for those in the field of catalysis to study reaction pathways.

Spain, ALBA

BL24 – CIRCE

Contact: Virginia Pérez Dieste (NAPP) / Michael Foerster (PEEM)

Techniques: XPS (100 – 2000 eV), NAP-XPS, PEEM, NEXAFS (NAPP), X-ray Absorption Spectroscopy (XAS) (NAPP), Heating and cooling (100-1500K on the PEEM endstation, -23 to 1000K on the NAPP endstation), LEED (both endstations), Mass spec (NAPP)

This beamline has 2 endstations, one dedicated to PEEM and one to NAP-XPS. Heating by infrared and cooling by Peltier element results in a system quite suitable for single crystal work and well as ‘real’ samples. Gas dosing system is automated and allows up to three different gases to be equipped at one time.

World

Australia, The Australian Synchotron

SXR: Soft X-ray Spectroscopy Beamline

Contact: Bruce Cowie

Techniques: XPS (90-2500 eV), XAS, NEXAFS, ARPES, LEED, STM, Sputtering, Cooling (LN/LHe)

A large energy range and wide array of techniques available make this a strong all-round beamline for XPS.

USA, Advanced Light Source (California)

9.3.1: Tender X-ray Spectroscopy

Contact: Ethan Crumlin

Techniques: XPS (2320 – 6000 eV), NAP-XPS, HAXPES, XAS

This beamline operates in the HAXPES energy range and has ambient pressure capabilities.

Beamline 9.3.2: Ambient-Pressure Soft X-Ray Photoelectron Spectroscopy (S-APXPS)

Contact: Ethan Crumlin

Techniques: XPS (200 – 900 eV), NAP-XPS

Much like the 9.3.1 beamline, but with soft X-rays.

10.0.1: Angle- and Spin-Resolved Photoelectron Spectroscopy

Contact: Sung-Kwan Mo

XPS (17-350 eV), ARPES, Spin-resolved photoemission

This beamline specialises in ARPES and analysis of spin-dependant electronic structure, ideal for those working in electronic materials.

USA, National Synchotron Light Source (New York)

7-ID-1: Spectroscopy Soft and Tender

Contact: Cherno Jaye

Techniques: XPS (100 – 2200 eV), NEXAFS

This beamline also has several advanced imaging endstations which are beyond the scope of this list

7-ID-2: Spectroscopy Soft and Tender

Contact: Conan Weiland

Techniques: XPS (2000 – 7500 eV), HAXPES

This beamline also has advanced imaging capabilities which are beyond the scope of this list

23-ID-2: In situ and Operando Soft X-ray Spectroscopy

Contact: Iradwikanari Waluyo

Techniques: XPS (250 – 2000 eV), NAP-XPS, XAS, Heating (~1200K)

This beamline offers a wide range of supplied gases for NAP-XPS experiments

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