Collaborators from the UK, France, Germany, Canada, Denmark and the USA – including our technical manager, Dr David Morgan – have published a recent article in Applied Surface Science Advances [1], highlighting the methodology developed from many years of interaction between junior and senior X-ray Photoelectron Spectroscopy (XPS) practitioners using CasaXPS processing software.
Discussions arising from a series of workshops, organised by the Institut des Matériaux Jean Rouxel (IMN), Nantes, have been a significant source for developing the overall XPS data processing concept and are the motivation for creating this work.
These workshops have aought to gather both experienced and novice users of XPS for a week-long programme covering experiment design and subsequent data processing. The framework both developed and used within these workshops encourages the dissemination of knowledge beyond XPS data analysis and strongly emphasises the the importance of a collaborative and multi-disciplinary approach to problem-solving in surface analysis.
The material presented embodies data treatment originating from data made available to the first CNRS Thematic Workshop which was presented at Roscoff 2013, whereas the methodology described has evolved over the subsequent workshops in 2016 and 2019 and currently represents the philosophy used in CasaXPS spectral data processing paradigm.
The article should also be used as a reference for the CasaXPS software.